X-ray spectrometry

Organizers: C. Streli (TU Wien, Austria), P. Wobrauschek (TU Wien, Austria)
Date: 15.-16.8. 2018
Venue: Atominstitut, Stadionallee 2, 1020 Vienna
– see:
ati.tuwien.ac.at/about_us/accessibility/EN/
Fee: 130 € (included: coffee during coffee breaks / lunch)

 

Thursday 15.8. Atominstitut lecture hall

Lectures
              9:00 – 10:30: Tutorial : X-ray spectrometry – P.Wobrauschek 
            10:30 – 11:00: Tutorial: Quantification – P.Kregsamer
            11:00 – 11:30: coffee break
            11:30 – 13:00: special techniques ( TXRF, GIXRF, MicroXRF, SRXRF) – C.Streli
            13:00 – 14:00: lunch break
            14:00 – 14:30: Applications: cultural heritage – M.Griesser?
            14:30 – 15:00: Applications: 2D elemental imaging of biol. Ma – A.Turyanskay
            15:00 – 15:30: Applications: TXRF of environmental samples – J.Prost
            15:30 – 16:00: Applications: GIXRF of ultrathin layers – D.Ingerle
            16:00 – 16:30: Applications: SR-XRF + XANES – M.Radtke
            16:30 – 17:00: coffee break
17:00-18:00  Poster session

Friday 16.8. Atominstitut X-ray labs

Hands-on training
            MAXI – introduction to qualitative EDXRF
            Epsilon 5 – standard EDXRF with secondary target
            TXRF – quantitative analysis of liquid sample
            Micro-XRF – 2 D imaging
            Hand-held (borough from IAEA?)

 

Both beginners and experienced X-ray scientists and applicants, physicists and chemists,  should gain information by attending the Satellite meeting. Presentations of most modern techniques and instrumentation for trace element analysis using  EDXRS will be given. Physical methods to improve minimum detection limits in XRF by background reduction will be discussed; Special emphasis will be on Synchrotron radiation as excitation source.  Introduction to total reflection XRF (TXRF) and actual instrumentation will show achievable advantages and results in terms of detection limits, sensitivities and detectable elemental range down to light elements ( eg.Carbon).  Confocal µ-XRF will be presented as method for 2D and 3D spatial resolved elemental imaging. Applications from interesting scientific fields as environment, microelectronics, forensic, and life science will show the successful use of the importance of the various XRF spectrometric techniques.